As a key leader within the High Bandwidth Memory (HBM) Product Engineering Media Health team, you will spearhead a high‑performing team that drives both intrinsic and extrinsic reliability test development and execution for Micron’s latest HBM products, including DRAM, interface die, and stacked products. Your responsibilities include driving extrinsic DPM reduction (Time 0 and Field DPM), leading the intrinsic reliability charter, and optimizing manufacturing test flow to meet critical KPIs of quality, cost, and cycle time. You will characterize product reliability, identify gaps, and manage root‑cause analysis and resolution of qualification and RMA failures relating to defectivity and intrinsic reliability margin. Additionally, you will lead frontend process conversion initiatives, collaborating with Fab, TD, and GQ teams to establish robust business processes that drive yield improvements, DPM and cost reductions, and will maintain strong cross‑functional communication with s...