• Work with front-end team, DFT, and cross-functional teams to provide the solutions and make sure DFT DRCs are fixed
  
• Generating high-quality manufacturing ATPG test patterns for (SAF) stuck-at, transition fault (TDF), Path Delay fault (PDF) models and through the use of on-chip test compression techniques.
  

Requirements

• BE/ BTech/ MTech/MS/ PhD in Electronics, Electrical, Computer Engineering or Computer Science Engineering with 4- 10 years of exp.
• Highly motivated and driven to face challenging design and debug problems
• In-depth knowledge and hands-on experience in scan insertion, ATPG, coverage analysis, and Transition delay test coverage analysis.
• Analyze the design and propose the best compression technique.
• In-depth knowledge and hands-on experience in Scan insertion and validation, BIST, LBIST, MBIST insertion and verification, ATPG, IP tests and Pattern Validation w/wo Timing, DFT mode timing an...